Nearfield Instruments, founded in 2016, is a technology company specialising in the development of advanced atomic force microscopy (AFM) systems for semiconductor metrology. Its core offering is the provision of atom-scale resolution 3D metrology at a throughput level suitable for high-volume industrial chip manufacturing environments. This capability addresses a critical need in the semiconductor industry for precise, high-speed measurement and characterisation of nanostructures during the production process.
The company's technical expertise spans several specialised domains, including high-throughput scanning probe microscopy, nano-optomechatronic instrumentation, and semiconductor metrology. Its product line features the QUADRA and AUDIRA systems, both engineered as AFM solutions designed to meet the stringent performance and speed requirements of semiconductor fabrication facilities.
Operating at the intersection of precision instrumentation and chip manufacturing, Nearfield Instruments focuses on a specific, demanding segment of the technology industry. Its work contributes to the metrology capabilities required for the continued advancement and quality control of modern semiconductor devices.